Suwon, South Korea

Ki Baek Yoon

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Hj Corp., Hyundai Motor Company, Kia Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ki Baek Yoon. Retrieved from https://idiyas.com/inventor/ki-baek-yoon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ki Baek Yoon: Inventor in Vehicle Interior Materials.

Introduction

Ki Baek Yoon is an inventor based in Suwon, South Korea. His work includes a patent for a retroreflective piping sheet designed for vehicle interior decoration. The patent record identifies 1 patent.

Latest Patents

Yoon’s patent, “Retroreflective Piping Sheet for Vehicle Interior Decoration and Manufacturing Method Thereof,” describes a layered material for vehicle interiors. It includes a circular-knitted fabric made from polyester and spandex ply yarn, a retroreflective layer containing glass beads, and a hot-melt adhesive layer on the opposite side of the fabric. The design combines reflective properties with a fabric structure intended for interior trim.

Career Highlights

Yoon’s listed professional affiliations include Hyundai Motor Company and Kia Corporation. His patent focuses on a material and manufacturing method relevant to vehicle interior decoration.

Collaborations

His work connects with the automotive sector through his listed affiliations with Hyundai Motor Company and Kia Corporation. The available information does not specify particular projects or co-inventors.

Conclusion

Ki Baek Yoon’s patent presents a retroreflective piping material for vehicle interiors, combining knitted fabric, glass beads, and hot-melt adhesive in a layered construction.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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