Iselin, NJ, United States of America

Khushmeen Sakloth

This inventor holds 1 USPTO granted patent. Top assignee: Basf Se Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Khushmeen Sakloth. Retrieved from https://idiyas.com/inventor/khushmeen-sakloth

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Khushmeen Sakloth and Patent Innovation in Chemical Process Monitoring.

Introduction

Khushmeen Sakloth is an inventor associated with Iselin, New Jersey, and BASF SE. His patent work addresses the monitoring and control of phase separation in chemical processes and samples.

Latest Patents

Sakloth is credited with 1 patent: “Method for Monitoring and/or Controlling Phase Separation in Chemical Processes and Samples.” The invention uses an image of a fluid sample and a data-driven model to determine phase information. The model can classify the boundary between two phases and identify properties such as its height, volume, type, or strength. This approach is intended to support analysis and control of phase separation.

Career Highlights

Sakloth’s listed patent reflects work at the intersection of chemical process monitoring and data-driven image analysis. His association with BASF SE connects this invention to a company active in the chemical industry.

Collaborations

Jens Meissner and Behrang Shafei are identified as Sakloth’s coworkers. Their names provide context for his professional network, though the supplied information does not specify their roles in the patent.

Conclusion

Khushmeen Sakloth’s patent applies image analysis and data-driven modeling to characterize phase boundaries in fluid samples, highlighting a practical innovation for chemical process monitoring.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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