Boxborough, MA, United States of America

Kevin Warren Furrow

This inventor holds 1 USPTO granted patent. Top assignee: Advanced Micro Devices Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kevin Warren Furrow. Retrieved from https://idiyas.com/inventor/kevin-warren-furrow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2024

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kevin Warren Furrow: Innovator in Texture Sampling Technology

Introduction

Kevin Warren Furrow is an accomplished inventor based in Boxborough, MA (US). He has made significant contributions to the field of texture sampling technology, particularly in the realm of computer graphics and data retrieval.

Latest Patents

Furrow holds a patent for "Sampling for Partially Resident Textures." This invention encompasses devices, systems, and methods for sampling partially resident texture data. The process involves receiving an instruction that includes a residency map descriptor, which is executed to retrieve partially resident texture data from a mipmap stored in memory based on the residency map descriptor. This innovation enhances the efficiency of texture data management in various applications.

Career Highlights

Furrow is currently employed at Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His work focuses on improving graphics processing and data handling, contributing to advancements in technology that benefit a wide range of users.

Collaborations

Throughout his career, Furrow has collaborated with notable colleagues, including Fataneh Ghodrat and Michael Lee Grossfeld. These partnerships have fostered innovation and have been instrumental in the development of new technologies.

Conclusion

Kevin Warren Furrow is a notable inventor whose work in texture sampling technology has made a significant impact in the field. His contributions continue to influence advancements in computer graphics and data management.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…