Seymour, CT, United States of America

Kevin W Baxter

This inventor holds 1 USPTO granted patent. Top assignee: Pitney Bowes Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kevin W Baxter. Retrieved from https://idiyas.com/inventor/kevin-w-baxter

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Kevin W. Baxter and His Insertion-System Invention.

Introduction

Kevin W. Baxter is an inventor associated with Seymour, Connecticut, and Pitney Bowes Inc. His patent work addresses the efficient operation of material-processing equipment.

Latest Patents

Baxter is credited with 1 patent: “Method for Committing Material to a Module of an Inserting System.” The invention describes a method for balancing throughput with the risk of system stoppages. An algorithm regulates the flow of material through a machine module and can reduce that flow when a downstream issue could cause a paper jam. This approach aims to improve overall system efficiency by avoiding excessive stoppages, even when doing so requires operating below maximum throughput.

Career Highlights

Baxter’s listed patent connects his inventive work with Pitney Bowes Inc. and focuses on managing material flow in an inserting system. The patent’s method uses operational adjustments to address potential disruptions and support more efficient machine performance.

Collaborations

Baxter’s listed coworkers include Joseph M. Mozdzer and David J. Eaton. Their names provide context for the colleagues associated with his professional and patent-related work.

Conclusion

Kevin W. Baxter’s patent presents a practical approach to improving insertion-system efficiency by balancing processing speed against the likelihood of stoppages.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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