Madison, WI, United States of America

Kevin S Menningen

This inventor holds 1 USPTO granted patent. Top assignee: Tomotherapy Incorporated. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kevin S Menningen. Retrieved from https://idiyas.com/inventor/kevin-s-menningen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Kevin S Menningen: Innovator in Contouring Technology

Introduction

Kevin S Menningen is a notable inventor based in Madison, Wisconsin. He has made significant contributions to the field of contouring technology, particularly with his innovative patent that enhances the precision of contouring tools.

Latest Patents

Kevin holds a patent for a "System and method of contouring a target area." This invention features a two-dimensional contouring tool that enables users to maintain a minimum distance in three-dimensional space from other structures. The tool allows for the rapid definition of contours that conform to existing shapes while adhering to user-specified margin limits.

Career Highlights

Kevin is currently employed at Tomotherapy Incorporated, where he applies his expertise in developing advanced contouring solutions. His work has been instrumental in improving the accuracy and efficiency of contouring processes in various applications.

Collaborations

Throughout his career, Kevin has collaborated with talented professionals, including David Gering and Kenneth Ruchala. These partnerships have fostered innovation and contributed to the success of their projects.

Conclusion

Kevin S Menningen's contributions to contouring technology exemplify the impact of innovative thinking in engineering. His patent and work at Tomotherapy Incorporated highlight his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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