This inventor holds 4 USPTO granted patents. Top assignees: Eni Technologies Inc., Eni Technology, Inc.. Active years: 1998-2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1998-2004
Title: Kevin S Gerrish: Innovator in RF Measurement Technology
Introduction
Kevin S Gerrish is a notable inventor based in Rochester, NY (US), recognized for his contributions to radio frequency (RF) measurement technology. With a total of 4 patents, Gerrish has developed innovative techniques that enhance the accuracy of current and voltage measurements in RF applications.
Latest Patents
Gerrish's latest patents include a voltage current sensor with high matching directivity. This invention provides a technique for measuring the current, voltage, and phase of an RF power wave to an RF load. It accounts for the finite length of the voltage and current pickups and corrects for the effects of standing wave components of voltage and current. The voltage and current are computed as complex functions of the voltage pickup signal and the current pickup signal, based on coefficients precalibrated for radio frequency. Alternatively, a corrected current value can be derived from the corrected voltage value and complex load impedance. The correction coefficients can be obtained for various calibrating radio frequencies within an RF range, using voltage and current pickup signals under different load conditions.
Career Highlights
Throughout his career, Kevin S Gerrish has worked with several companies, including Eni Technologies Inc. and Eni Technology, Inc. His work has significantly impacted the field of RF technology, leading to advancements in measurement techniques.
Collaborations
Gerrish has collaborated with notable professionals in his field, including Daniel F Vona, Jr. and Kevin P Nasman. These collaborations have contributed to the development of innovative solutions in RF measurement.
Conclusion
Kevin S Gerrish's work in RF measurement technology showcases his innovative spirit and dedication to advancing the field. His patents reflect a commitment to improving measurement accuracy, which is essential for various applications in technology today.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
