Clifton Springs, NY, United States of America

Kevin J Vent


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Kevin J Vent: Innovator in Distance Measurement Technology

Introduction

Kevin J Vent is a notable inventor based in Clifton Springs, NY (US). He has made significant contributions to the field of optical measurement technology. His innovative work has led to the development of a unique patent that enhances the precision of distance measurement.

Latest Patents

Kevin J Vent holds a patent for a "Compact distance measuring interferometer." This invention features a sophisticated design that includes a source for generating a source beam of linearly polarized coherent light. The interferometer utilizes a non-polarizing beam splitter to create reference and measuring beams, which are then recombined to form an interfering beam. The design incorporates various optical components, such as half wave plates and polarizing beam splitters, to ensure accurate measurement of distances by analyzing the interference patterns of the light beams.

Career Highlights

Kevin J Vent is associated with Gradient Lens Corporation, where he applies his expertise in optical technologies. His work at the company has been instrumental in advancing the capabilities of distance measurement devices. With a focus on innovation, he continues to contribute to the field through his research and development efforts.

Collaborations

Throughout his career, Kevin has collaborated with talented individuals such as Leland G Atkinson, III and Jeffrey P Wong. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Kevin J Vent is a distinguished inventor whose work in distance measurement technology has made a significant impact. His patent for the compact distance measuring interferometer exemplifies his commitment to innovation and precision in optical measurements.

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