Kevin J Owens

Title: Kevin J Owens - Innovator in Scanned-Probe Microscopy

Introduction

Kevin J Owens is a notable inventor based in Pittsford, NY (US). He has made significant contributions to the field of microscopy, particularly with his innovative designs that enhance the functionality of scanned-probe microscopes. His work is characterized by a commitment to advancing scientific research through practical inventions.

Latest Patents

Kevin J Owens holds a patent for a "Support device and stage assembly for a scanned-probe microscope." This invention features a support device that includes a horizontal base member and a vertical bridge member, which are arranged transversely. The design allows for the attachment of a scanned-probe microscope to the vertical bridge member, providing stability and ease of use. The device also incorporates bracket members that enhance its structural integrity, ensuring that the upper surfaces of the base and chord members are coplanar to support a separable sample plate.

Career Highlights

Owens is currently associated with Burleigh Instruments, Inc., where he applies his expertise in developing advanced microscopy solutions. His work at the company has been instrumental in pushing the boundaries of what is possible in scientific imaging and analysis.

Collaborations

One of his notable collaborators is Gordon M Shedd, with whom he has worked on various projects related to microscopy and imaging technologies.

Conclusion

Kevin J Owens is a distinguished inventor whose contributions to scanned-probe microscopy have made a lasting impact on the field. His innovative designs continue to facilitate advancements in scientific research and technology.