Highland, NY, United States of America

Kevin J Duffy


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):

Title: Kevin J Duffy: Innovator in Memory Testing Systems

Introduction

Kevin J Duffy is a notable inventor based in Highland, NY (US). He has made significant contributions to the field of memory testing systems, showcasing his expertise through his innovative designs and patents. His work is particularly recognized in the realm of built-in self-test systems for memory arrays.

Latest Patents

Kevin J Duffy holds a patent for a memory testing system, specifically an array built-in self-test (ABIST) system. This system includes a first latch with a first data input, a first scan input, and a first output, along with a second latch featuring a second data input, a second scan input, and a second output. The first ABIST logic block is coupled to the first output, comparing a first expected value with a first data value received at the first data input after a clock is applied to the first latch. Similarly, the second ABIST logic block is connected to the second output, performing a comparison of a second expected value with a second data value received at the second data input after a clock is applied to the second latch. This innovative approach enhances the reliability and efficiency of memory testing.

Career Highlights

Kevin J Duffy is associated with International Business Machines Corporation (IBM), where he has contributed to various projects and advancements in technology. His work at IBM has allowed him to collaborate with other talented professionals in the field, further enhancing his skills and knowledge.

Collaborations

Some of Kevin's notable coworkers include William Vincent Huott and Pradip Patel. Their collaboration has likely fostered an environment of innovation and creativity, leading to advancements in their respective projects.

Conclusion

Kevin J Duffy is a distinguished inventor whose work in memory testing systems has made a significant impact in the technology sector. His patent for the ABIST system exemplifies his innovative spirit and dedication to improving memory testing methodologies.

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