The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2012
Filed:
Jun. 09, 2010
Kevin J. Duffy, Highland, NY (US);
William V. Huott, Holmes, NY (US);
Pradip Patel, Poughkeepsie, NY (US);
Daniel Rodko, Poughkeepsie, NY (US);
Kevin J. Duffy, Highland, NY (US);
William V. Huott, Holmes, NY (US);
Pradip Patel, Poughkeepsie, NY (US);
Daniel Rodko, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An array built-in self test (ABIST) system includes a first latch having a first data input, a first scan input and first output and a second latch having a second data input, a second scan input and a second output. The system also includes a first ABIST logic block coupled to the first output that compares a first expected value with a first data value received at the first data input and provided to the first ABIST logic block after a first clock is applied to the first latch. The system also includes a second ABIST logic block coupled to the second output that compares a second expected value with a second data value received at the second data input and provided to the second ABIST logic block after a second clock is applied to the second latch.