Kevin Dennis Woodling

Title: Kevin Dennis Woodling: Innovator in Integrated Circuit Testing

Introduction

Kevin Dennis Woodling is a notable inventor based in Austin, TX. He has made significant contributions to the field of integrated circuit testing, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of testing methods for system-on-chip (SoC) devices.

Latest Patents

One of his latest patents is titled "Method and apparatus for testing delay faults." This invention provides an apparatus or method for testing SoC processor devices, minimizing interference caused by low-speed testing devices interfacing with high-speed processors. The implementation involves gating the input clock signal at the clock input to each domain of the SoC processor, controlled by clock stop signals generated by the testing device. This approach allows for a more natural state during testing and enables individual domain testing.

Another significant patent is "Integrated circuit with blocking pin to coordinate entry into test mode." This integrated circuit includes a blocking pin and state logic, along with a test control unit that manages access to the operating state during test mode. The design allows shared interface pins to perform distinct I/O functions during normal operation while providing input signals to the test control unit during testing. The blocking pin ensures that the integrated circuit can enter test mode without resetting the operating state of the state logic.

Career Highlights

Kevin has worked with prominent companies such as Oracle America, Inc. and IBM. His experience in these organizations has contributed to his expertise in integrated circuit design and testing methodologies.

Collaborations

Throughout his career, Kevin has collaborated with notable colleagues, including Thomas Alan Ziaja and Robert F. Molyneaux. These collaborations have further enriched his work and innovations in the field.

Conclusion

Kevin Dennis Woodling is a distinguished inventor whose contributions to integrated circuit testing have advanced the industry. His innovative patents reflect his commitment to improving testing methodologies for SoC devices.