Company Filing History:
Years Active: 2003-2008
Title: Kevin Cota: Innovator in Reliability Risk Identification
Introduction
Kevin Cota is a notable inventor based in Portland, OR (US), recognized for his contributions to the field of reliability risk identification in semiconductor manufacturing. With a total of 8 patents to his name, Cota has developed innovative methods that enhance the efficiency and accuracy of identifying potential risks in die reliability.
Latest Patents
Cota's latest patents include a method to selectively identify reliability risk die based on characteristics of local regions on the wafer. This method involves computing particle sensitive yield and utilizing it to identify reliability risk die. A bin characteristics database is maintained to identify hard and soft bins sensitive to different failure mechanisms. The process determines if the particle sensitive yield of the local region around the current die is below a pre-set threshold, leading to a downgrade of the die if necessary. Another significant patent is a method to selectively identify at-risk die based on location within the reticle. This system stores reticle and stepping information in a database, allowing for the calculation of pass/fail or specific bin yield of reticle fields. It assesses whether the yield of certain reticle locations falls below a statistical measure by a predetermined threshold, resulting in the downgrading of all die in that location.
Career Highlights
Throughout his career, Kevin Cota has worked with prominent companies such as LSI Logic Corporation and LSI Corporation. His experience in these organizations has contributed to his expertise in semiconductor technology and reliability risk assessment.
Collaborations
Cota has collaborated with notable professionals in the industry, including Robert Madge and Manu Rehani. These collaborations have further enriched his work and innovations in the field.
Conclusion
Kevin Cota's innovative approaches to reliability risk identification have made significant impacts in the semiconductor industry. His patents reflect a deep understanding of the complexities involved in ensuring die reliability, showcasing his role as a leading inventor in this critical area.