Daejeon, South Korea

Keun Deok Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Itc Incorporated. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keun Deok Lee. Retrieved from https://idiyas.com/inventor/keun-deok-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Keun Deok Lee: Inventor of an Electromagnetic Wave Irradiation Apparatus.

Introduction

Keun Deok Lee is an inventor associated with Daejeon, South Korea, and Itc Incorporated. His patent work includes an electromagnetic wave irradiation apparatus designed to emit electromagnetic waves and measure changes in the antenna’s capacitance.

Latest Patents

Lee is associated with 1 patent, titled “Irradiation Apparatus of Electromagnetic Waves.” The invention describes a housing with a hollow interior and an open lower side, a spiral coil-type antenna positioned inside the housing, and a window attached to its lower opening. A capacitance variation measurement unit measures changes in the antenna’s capacitance, using a capacitance sensor connected between the antenna and ground. The apparatus may also include a cooling unit for the window, the housing, or both.

Career Highlights

Lee’s documented patent contribution focuses on electromagnetic wave irradiation and monitoring antenna capacitance. The design combines an emitting antenna with measurement and optional cooling components.

Collaborations

Lee is associated with Itc Incorporated. The available information identifies the company connection but does not specify collaborators or additional joint projects.

Conclusion

Keun Deok Lee’s patent describes an electromagnetic wave irradiation apparatus that integrates a spiral antenna, capacitance measurement, and optional cooling features.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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