Yongin, South Korea

Keum-seok Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keum-seok Lee. Retrieved from https://idiyas.com/inventor/keum-seok-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Keum-seok Lee: Inventor in Image Noise Reduction.

Introduction

Keum-seok Lee is an inventor based in Yongin, South Korea. His patent work includes a method and apparatus for reducing image noise and improving visibility.

Latest Patents

Lee is associated with 1 patent, titled “Method of and Apparatus for Eliminating Image Noise.” The invention estimates spatial-temporal noise using information from neighboring pixels in the current and previous frames. It then filters the current pixel by weighting nearby spatial-temporal pixels according to the estimated noise level. Finally, it combines weighted noise-filtered and boosted pixels based on edge intensity to help preserve image detail while reducing noise.

Career Highlights

Lee is associated with Samsung Electronics Co., Ltd. His patent describes an approach to image processing that uses information across both space and time to improve visibility.

Collaborations

The provided information identifies Ju-hee Park and Young-hoon Jeong as Lee’s coworkers. It does not specify whether they collaborated with him on this patent.

Conclusion

Keum-seok Lee’s documented invention focuses on reducing spatial-temporal image noise while accounting for edge intensity, reflecting his work in image-processing technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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