Gyeonggi-do, South Korea

Keum Do Ban

This inventor holds 1 USPTO granted patent. Top assignee: Hynix Semiconductor Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keum Do Ban. Retrieved from https://idiyas.com/inventor/keum-do-ban

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Keum Do Ban: Innovator in Semiconductor Manufacturing

Introduction

Keum Do Ban is a prominent inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of semiconductor manufacturing. His innovative methods have paved the way for advancements in technology.

Latest Patents

Keum Do Ban holds a patent for a "Method for manufacturing a semiconductor device." This method involves several steps, including forming an etch-target layer over a semiconductor substrate, creating a first mask pattern, and etching the etch-target layer to form a fine pattern. His work in this area has been crucial for the development of more efficient semiconductor devices.

Career Highlights

Keum Do Ban is associated with Hynix Semiconductor Inc., a leading company in the semiconductor industry. His role at Hynix has allowed him to apply his innovative ideas in a practical setting, contributing to the company's success and technological advancements.

Collaborations

Throughout his career, Keum Do Ban has collaborated with notable colleagues, including Ki Lyoung Lee and Cheol Kyu Bok. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Keum Do Ban's contributions to semiconductor manufacturing highlight his role as an influential inventor in the technology sector. His patent and work at Hynix Semiconductor Inc. demonstrate his commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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