Seoul, South Korea

Keum Bo Na

This inventor holds 1 USPTO granted patent. Top assignee: Hyosung Tns Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Keum Bo Na. Retrieved from https://idiyas.com/inventor/keum-bo-na

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Keum Bo Na and ATM Maintenance Innovation.

Introduction

Keum Bo Na is an inventor based in Seoul, South Korea, associated with Hyosung TNS Inc. His patent work addresses the diagnosis and maintenance of automated teller machines (ATMs).

Latest Patents

The provided information lists one patent for Keum Bo Na: “Method for Diagnosing Failure of and Providing Maintenance Information About ATM.” The invention uses sensor readings collected during a failed transaction to identify where an abnormal value first occurred. It then predicts the module that may have caused the abnormal operation and provides maintenance workers with information about both the module where the failure occurred and the suspected cause. This approach is intended to help technicians repair the affected module and address the underlying cause. The record lists 1 patent.

Career Highlights

Keum Bo Na is associated with Hyosung TNS Inc., a company whose work includes ATM technology. His listed invention focuses on using sensor data to support more informed troubleshooting and maintenance.

Collaborations

The provided information names Kyung Il Ha and Il Je Hyung as Keum Bo Na’s coworkers. It does not specify their roles in the patent or whether they collaborated on this invention.

Conclusion

Keum Bo Na’s listed patent applies sensor-based diagnosis to ATM maintenance, helping technicians identify both a failure location and a possible underlying cause.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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