Kerwin Fu

Title: Innovations by Kerwin Fu in Noise Measurement Technology

Introduction

Kerwin Fu is an accomplished inventor based in Santa Clara, CA. He has made significant contributions to the field of semiconductor technology, particularly in the area of noise measurement in integrated circuits. His innovative techniques have the potential to enhance the reliability and performance of electronic devices.

Latest Patents

Kerwin Fu holds a patent for a technique titled "Technique for enabling on-die noise measurement during ATE testing and IST." This patent introduces a method that reliably measures on-die noise of logic within a chip. The technique involves placing a noise measurement system in specific partitions of the chip that are expected to generate the most noise. By utilizing a continuous free-running clock, the noise measurement circuit can measure voltage noise during a shift phase, which was previously unattainable with conventional methods. This advancement allows for a more comprehensive noise measurement during both ATE testing and in-field IST.

Career Highlights

Kerwin Fu is currently employed at Nvidia Corporation, where he continues to work on innovative technologies that push the boundaries of semiconductor design and testing. His expertise in noise measurement techniques has positioned him as a valuable asset in the industry.

Collaborations

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Conclusion

Kerwin Fu's contributions to noise measurement technology represent a significant advancement in the field of semiconductor testing. His innovative techniques are set to improve the performance and reliability of electronic devices in various applications.