Moorestown, NJ, United States of America

Kerry O'mara

This inventor holds 1 USPTO granted patent, plus 2 CIPO patents and 2 EPO patents. Top assignee: Opex Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kerry O'mara. Retrieved from https://idiyas.com/inventor/kerry-o-mara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

 

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kerry O'Mara - Innovator in Document Imaging Technology

Introduction

Kerry O'Mara is a talented inventor based in Moorestown, NJ (US). She is currently associated with Opex Corporation, where she contributes her expertise in developing innovative solutions. Although she has not yet been granted any patents, her work in the field of document imaging technology is noteworthy.

Latest Patent Applications

Kerry O'Mara's latest patent application is titled "Document Imaging System And Method For Imaging Documents." This application describes a method and apparatus for processing documents. The documents may be conveyed to a feeder for feeding documents to a scanner. The scanner scans each document to obtain image data and then discharges the document to one or more output or sort locations. The system may include a skew reduction assembly for reducing skew in the documents as they are fed to the scanner. Additionally, the system may include elements for improving image quality and reducing document damage while the document is scanned. Features for improving the stacking of the discharged documents are also included in this innovative system.

Conclusion

Kerry O'Mara is making significant strides in the field of document imaging technology, showcasing her potential as an inventor. Her latest patent application reflects her commitment to enhancing document processing systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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