Yokohama, Japan

Kenzo Tamaki


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1983

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1 patent (USPTO):Explore Patents

Title: Kenzo Tamaki: Innovator in Subscriber Line Testing Systems

Introduction

Kenzo Tamaki is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of telecommunications, particularly in the development of systems for testing subscriber lines. His innovative approach has led to the creation of a patented technology that enhances the efficiency of line testing.

Latest Patents

Kenzo Tamaki holds a patent for a Subscriber Line Testing System. This system is designed to test subscriber lines and terminals by directing the subscriber line to the testing system through an associated semiconductor switch driven by a constant current. The system includes a circuit for varying the current fed through the switch from the subscriber line being tested. Additionally, it features a circuit for measuring current values corresponding to the circuit states and a circuit for determining a current value that eliminates the constant current component for driving the switch.

Career Highlights

Throughout his career, Kenzo Tamaki has worked with prominent companies in the telecommunications sector. He has been associated with Hitachi, Ltd. and Nippon Telegraph and Telephone Public Corporation. His experience in these organizations has contributed to his expertise in developing innovative testing systems.

Collaborations

Kenzo has collaborated with notable colleagues, including Takafumi Kojima and Shiro Yokota. Their combined efforts have further advanced the field of telecommunications and contributed to the success of various projects.

Conclusion

Kenzo Tamaki's contributions to the field of telecommunications through his patented Subscriber Line Testing System demonstrate his innovative spirit and technical expertise. His work continues to influence the industry and improve the efficiency of line testing systems.

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