Forney, TX, United States of America

Kenyan Degles Burnham

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenyan Degles Burnham. Retrieved from https://idiyas.com/inventor/kenyan-degles-burnham

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations of Kenyan Degles Burnham

Introduction

Kenyan Degles Burnham is an accomplished inventor based in Forney, Texas. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a patent that addresses critical aspects of chip information management.

Latest Patents

Kenyan holds a patent for "Methods and apparatus to provide register information of semiconductor chips." This patent outlines a sophisticated apparatus that includes accessing chip information, removing redundant data, and classifying the information into different access permissions. The process ensures efficient storage of classified chip information in memory, enhancing the management of semiconductor chips.

Career Highlights

Kenyan is currently employed at Texas Instruments Corporation, a leading company in semiconductor design and manufacturing. His role involves leveraging his expertise to develop advanced technologies that improve the functionality and efficiency of semiconductor devices.

Collaborations

Throughout his career, Kenyan has collaborated with notable colleagues, including J Paul Austin Carpenter and Brady Charles Ramsey. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Kenyan Degles Burnham's contributions to semiconductor technology exemplify the spirit of innovation. His patent and work at Texas Instruments Corporation highlight his commitment to advancing the field. His collaborations further enhance the impact of his inventions in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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