Company Filing History:
Years Active: 2021-2025
Title: Kentaro Ohira: Innovator in Image Recognition and Semiconductor Evaluation
Introduction
Kentaro Ohira is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the fields of image recognition and semiconductor technology. With a total of 2 patents, his work has garnered attention for its innovative approaches and practical applications.
Latest Patents
Kentaro Ohira's latest patents include an image recognition system that calculates the importance of features for each target shape recognized in an image. This system determines the correctness of recognition results by comparing the importance with statistical data for each type of feature. Another notable patent is a semiconductor substrate for evaluation, which is designed to quantitatively evaluate the defect detection sensitivity of inspection devices. This invention addresses the challenges of evaluating defects in semiconductor substrates by utilizing a mirror electron image to detect defects through a series of first indentations formed in the substrate.
Career Highlights
Kentaro Ohira is currently employed at Hitachi High-Tech Corporation, where he continues to develop innovative technologies. His work has been instrumental in advancing the capabilities of inspection devices and image recognition systems.
Collaborations
Kentaro has collaborated with notable coworkers, including Masaki Hasegawa and Tomohiko Ogata, contributing to a dynamic and innovative work environment.
Conclusion
Kentaro Ohira's contributions to technology through his patents reflect his dedication to innovation in image recognition and semiconductor evaluation. His work continues to influence the industry and pave the way for future advancements.