Tokyo, Japan

Kenta Nakayama

This inventor holds 1 USPTO granted patent. Top assignee: Wingarc1st Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenta Nakayama. Retrieved from https://idiyas.com/inventor/kenta-nakayama-th86glvr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Kenta Nakayama: Innovator in Code Reading Technology

Introduction: Kenta Nakayama is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of code reading technology. His innovative approach has led to the development of a unique device that enhances the accuracy of barcode reading.

Latest Patents: Kenta Nakayama holds a patent for a code reading device and code reading program. This device is equipped with a region extracting unit that divides a photographed image of a barcode into multiple horizontal areas. It extracts readable regions from these areas and couples them to restore the entire barcode. This technology allows for accurate reading of barcodes even when parts are unreadable due to dirt or lighting conditions.

Career Highlights: Kenta Nakayama is currently employed at Wingarc1st Inc., where he continues to innovate in the field of code reading technology. His work has been instrumental in improving the reliability of barcode scanning in various applications.

Collaborations: Kenta collaborates with Ko Shimazawa, a coworker at Wingarc1st Inc. Together, they work on advancing the technology behind code reading devices.

Conclusion: Kenta Nakayama's contributions to code reading technology exemplify the impact of innovative thinking in solving real-world problems. His patent showcases the potential for enhancing barcode reading accuracy, which is crucial in many industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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