Aomori, Japan

Kenta Mikami

This inventor holds 2 USPTO granted patents. Top assignee: Fuji Electric Co., Ltd.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenta Mikami. Retrieved from https://idiyas.com/inventor/kenta-mikami

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Location History:

  • Kawasaki, JP (2013)
  • Aomori, JP (2013)

Company Filing History:


Years Active: 2013

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Kenta Mikami: Innovator in Radiation Monitoring Technology

Introduction

Kenta Mikami is a notable inventor based in Aomori, Japan. He has made significant contributions to the field of radiation monitoring technology. With a total of 2 patents to his name, Mikami is recognized for his innovative approach to measuring radiation levels.

Latest Patents

Mikami's latest patents include a radiation monitor and a radiation measuring apparatus. These inventions are designed to enhance the accuracy and efficiency of radiation detection, which is crucial for various applications in health and safety.

Career Highlights

Kenta Mikami is currently employed at Fuji Electric Co., Ltd., where he continues to develop cutting-edge technologies. His work at this esteemed company has allowed him to focus on innovations that address critical needs in radiation safety.

Collaborations

Mikami has collaborated with talented coworkers such as Tomoya Nunomiya and Kei Aoyama. Together, they contribute to advancing technology in their field.

Conclusion

Kenta Mikami's work in radiation monitoring exemplifies the impact of innovation in ensuring safety and accuracy in measuring radiation levels. His contributions are vital to the ongoing development of technology in this important area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…