Location History:
- Albany, CA (US) (1994)
- Los Altos, CA (US) (1995 - 2009)
- Bexley, OH (US) (2010 - 2016)
- Colombus, OH (US) (2020)
- Bethesda, MD (US) (2005 - 2024)
Company Filing History:
Years Active: 1994-2024
Title: The Innovations of Kent Johnson: A Leader in Patented Technologies
Introduction
Kent Johnson, based in Bethesda, MD, is a prolific inventor with an impressive portfolio of 20 patents. His contributions to technological advancements have made him a notable figure in the fields of display technologies and luminescence testing.
Latest Patents
Among his latest patents is a novel display panel or screen featuring a graphical user interface. This innovation has potential applications across various electronic devices, enhancing user interaction and experience. Additionally, he has developed assay plates, reader systems, and methods for luminescence test measurements. This patent outlines the use of an assay module with integrated electrodes and a specialized reader apparatus. The methodology focuses on inducing luminescence—preferably electrode-induced luminescence—within the assay regions to accurately measure induced luminescence, significantly improving the reliability of test results.
Career Highlights
Kent has contributed his expertise in several renowned companies, particularly noteworthy is his work at Mesoscale Technologies, LLC. His role in these organizations has allowed him to push the boundaries of innovation and contribute significantly to the scientific community.
Collaborations
Throughout his career, Kent has worked alongside esteemed colleagues, including Eli N. Glezer and Charles M. Clinton. Their collaborations have fostered an environment of creativity and knowledge sharing, leading to the successful development of impactful technologies.
Conclusion
Kent Johnson stands out as an innovative inventor whose 20 patents reflect his dedication to enhancing technology in meaningful ways. His work will undoubtedly continue to influence future advancements in display technology and luminescence measurement.