The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Dec. 23, 2010
Applicants:

Eli N. Glezer, Chevy Chase, MD (US);

Kent Johnson, Bexley, OH (US);

Michael Tsionsky, Gaithersburg, MD (US);

John H. Kenten, Boyds, MD (US);

Jeff D. Debad, Gaithersburg, MD (US);

Robert M. Umek, Silver Spring, MD (US);

Paula Denney Eason, Germantown, MD (US);

Hans Biebuyck, Gaithersburg, MD (US);

Jacob N. Wohlstadter, Potomac, MD (US);

James Wilbur, Boyds, MD (US);

George Sigal, Rockville, MD (US);

Niranjan Y. Sardesai, North Wales, PA (US);

Inventors:

Eli N. Glezer, Chevy Chase, MD (US);

Kent Johnson, Bexley, OH (US);

Michael Tsionsky, Gaithersburg, MD (US);

John H. Kenten, Boyds, MD (US);

Jeff D. Debad, Gaithersburg, MD (US);

Robert M. Umek, Silver Spring, MD (US);

Paula Denney Eason, Germantown, MD (US);

Hans Biebuyck, Gaithersburg, MD (US);

Jacob N. Wohlstadter, Potomac, MD (US);

James Wilbur, Boyds, MD (US);

George Sigal, Rockville, MD (US);

Niranjan Y. Sardesai, North Wales, PA (US);

Assignee:

MESO SCALE TECHNOLOGIES, LLC., Rockville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); C12Q 1/48 (2006.01); G01N 33/68 (2006.01);
U.S. Cl.
CPC ...
G01N 33/5438 (2013.01); C12Q 1/485 (2013.01); G01N 33/54366 (2013.01); G01N 33/54373 (2013.01); G01N 33/54386 (2013.01); G01N 33/68 (2013.01); G01N 33/6803 (2013.01); G01N 33/6842 (2013.01); G01N 33/6845 (2013.01); Y10S 436/807 (2013.01);
Abstract

Multiplexed test measurements are conducted using an assay module having a plurality of assay domains. In preferred embodiments, these measurements are conducted in assay modules having integrated electrodes with a reader apparatus adapted to receive assay modules, induce luminescence, preferably electrode induced luminescence, in the wells or assay regions of the assay modules and measure the induced luminescence.


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