Ibaraki, Japan

Kensuke Nakamichi

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 1978.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kensuke Nakamichi. Retrieved from https://idiyas.com/inventor/kensuke-nakamichi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 1978

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1 patent (USPTO):Explore Patents

Title: Kensuke Nakamichi: Innovator in Moisture Measurement Technology

Introduction

Kensuke Nakamichi is a notable inventor based in Ibaraki, Japan. He has made significant contributions to the field of moisture measurement technology. His innovative work has led to the development of a specialized device that aids in accurately determining moisture content.

Latest Patents

Kensuke Nakamichi holds a patent for a moisture content meter. This device is designed to provide precise measurements of moisture levels, which is essential in various industries. His patent is a testament to his expertise and dedication to advancing technology in this area. He has 1 patent to his name.

Career Highlights

Nakamichi is associated with Matsushita Electric Industrial Co., Ltd., a company renowned for its commitment to innovation and quality. His role at the company has allowed him to work on cutting-edge projects that enhance product performance and reliability.

Collaborations

Throughout his career, Kensuke Nakamichi has collaborated with talented individuals such as Yukio Miyai and Takeshi Kojo. These partnerships have fostered a creative environment that encourages the exchange of ideas and expertise.

Conclusion

Kensuke Nakamichi's contributions to moisture measurement technology exemplify his innovative spirit and commitment to excellence. His work continues to impact various industries, showcasing the importance of accurate moisture measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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