Boulder, CO, United States of America

Kenneth Shouldice

This inventor holds 1 USPTO granted patent and 3 EPO patents. Top assignee: Ricoh Company, Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenneth Shouldice. Retrieved from https://idiyas.com/inventor/kenneth-shouldice

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Kenneth Shouldice - Innovator in Inspection Production Control Mechanisms

Introduction: Kenneth Shouldice is an inventor based in Boulder, Colorado, known for his contributions to the field of inspection production control mechanisms. He currently works for Ricoh Company, Ltd., where he focuses on developing innovative solutions for print job inspections. Although he does not hold any granted patents, his work in patent applications showcases his commitment to advancing technology in this area.

Latest Patent Applications: Kenneth Shouldice's notable patent application is titled "Inspection Production Control Mechanism." This system includes at least one physical memory device to store inspection logic and one or more processors coupled with the memory device. The processors execute the inspection logic to capture a page image of a print job printed on a print medium. The system determines a page identifier (page ID) value on the page image and checks whether the page ID value is within a first production range associated with a first inspection production. Upon determining that the page ID value is within the first production range, the system performs inspection processing using the first inspection production on the page image.

Conclusion: Kenneth Shouldice's work in inspection production control mechanisms highlights his innovative spirit and dedication to improving print job inspections. His contributions, although not yet reflected in granted patents, demonstrate the potential for future advancements in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…