Ontario, NY, United States of America

Kenneth L Sheehan

USPTO Granted Patents = 4 

Average Co-Inventor Count = 1.8

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2011-2019

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4 patents (USPTO):Explore Patents

Title: The Innovations of Kenneth L. Sheehan

Introduction

Kenneth L. Sheehan is a notable inventor based in Ontario, NY (US). He has made significant contributions to the field of technology, particularly in the development of advanced sensor systems. With a total of four patents to his name, Sheehan's work reflects a commitment to innovation and practical applications in engineering.

Latest Patents

One of Kenneth L. Sheehan's latest patents is an articulated head with multiple sensors for measuring machines. This invention features an articulated sensor head that includes three different sensor modules. A first of the sensor modules is carried on an extended shank that is mounted in a pivotable fashion from an articulating wrist. A housing carrying a second and a third of the sensor modules is releasably fastened to the extended shank. The second and third sensor modules are carried by the housing in a fixed angular orientation with respect to the orientation of the first sensor module. This innovative design enhances the capabilities of measurement systems in various applications.

Career Highlights

Kenneth L. Sheehan is associated with Quality Vision International Inc., where he continues to push the boundaries of technology. His work at this company has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of his notable coworkers include Edward Tarry Polidor and Joseph C. LaPlaca. Their combined expertise contributes to the innovative environment at Quality Vision International Inc.

Conclusion

Kenneth L. Sheehan's contributions to the field of technology through his patents and collaborations highlight his role as a significant inventor. His work continues to influence advancements in sensor technology and measurement systems.

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