Company Filing History:
Years Active: 2002-2007
Title: The Innovations of Kenneth J. Lanier
Introduction
Kenneth J. Lanier is a notable inventor based in Medway, MA (US), recognized for his contributions to electronic testing technology. With a total of four patents to his name, Lanier has made significant advancements in the field of integrated circuit testing.
Latest Patents
One of Lanier's latest inventions is the Single Platform Electronic Tester. This innovative device integrates digital, analog, and memory test circuitry onto a single platform. The tester is designed to evaluate various types of devices under test, including system-on-a-chip integrated circuits, mixed signal integrated circuits, digital integrated circuits, and analog integrated circuits. The digital test circuitry applies digital test signals and receives corresponding digital outputs, while the analog test circuitry does the same for analog signals. Additionally, the memory test circuitry applies memory test patterns and receives memory outputs. A supervising tester computer manages the application of these test signals, allowing for a flexible testing environment that can utilize solely digital, solely analog, solely memory, or a combination of all three types of signals.
Career Highlights
Lanier's career has been marked by his work at LTX Corporation, where he has played a pivotal role in developing advanced testing solutions. His expertise in electronic testing has positioned him as a key figure in the industry.
Collaborations
Throughout his career, Lanier has collaborated with notable colleagues, including Roger W. Blethen and H. Neil Kelly. These partnerships have contributed to the successful development of innovative testing technologies.
Conclusion
Kenneth J. Lanier's contributions to electronic testing through his patents and work at LTX Corporation highlight his significant impact on the field. His innovations continue to shape the future of integrated circuit testing technology.