Company Filing History:
Years Active: 2004
Title: The Innovative Contributions of Kenneth Dean Karklin in Semiconductor Testing
Introduction
Kenneth Dean Karklin, a prominent inventor based in San Francisco, California, has made significant strides in the field of semiconductor testing. With an impressive patent under his name, Karklin has demonstrated his commitment to enhancing the efficiency and accuracy of automatic wafer testing systems.
Latest Patents
Kenneth Karklin holds a patent for a "Unified apparatus and method to assure probe card-to-wafer parallelism in semiconductor automatic wafer test, probe card measurement systems, and probe card manufacturing." This innovative planarization gauge ensures probe card-to-wafer parallelism in semiconductor automatic test equipment (ATE) used for wafer testing. The design features two planar and parallel surfaces that serve as a standard system reference plane during the building and testing of ATE components. With accessible depth gauge holes and optical targets recognizable by a prober's upward-looking camera, this gauge is mechanically interchangeable with different probe cards, enhancing compatibility across various planarization methods used in ATE components. It is crucial that the gauge is manufactured and inspected to maintain traceability to established standards, such as those set by the National Institute of Standards and Technology (NIST). This patent ensures consistent correlation between the planarization methods across vendors, making it a valuable asset in the semiconductor industry.
Career Highlights
Karklin is affiliated with Agilent Technologies, Inc., a leading organization in electronic measurement technologies. Through his role, he has contributed to advancements that drive efficiencies in semiconductor testing processes, showcasing his technical expertise and innovative spirit.
Collaborations
Throughout his career, Kenneth has worked alongside notable professionals such as Nasser Ali Jafari and William T. Sprague. Their collaborative efforts have undoubtedly enriched Karklin’s contributions to the field, combining talents to push the boundaries of semiconductor technology and testing methods.
Conclusion
Kenneth Dean Karklin's work in semiconductor testing has marked him as an important figure in the field of innovation. His patent on a unified planarization gauge stands as a testament to his inventive capabilities and dedication to improving automatic wafer testing systems. As technology continues to evolve, Karklin's contributions will likely serve as foundational elements for future advancements in semiconductor manufacturing and testing.