Maryland Heights, MO, United States of America

Kenneth David Naumann

This inventor holds 1 USPTO granted patent. Top assignee: Toyota Automated Logistics Americas, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenneth David Naumann. Retrieved from https://idiyas.com/inventor/kenneth-david-naumann

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kenneth David Naumann and Centralized Palletizing Systems.

Introduction

Kenneth David Naumann is an inventor associated with Maryland Heights, Missouri, United States. His patent work concerns palletizing technology and centralized management of stacking patterns. He is associated with Toyota Automated Logistics Americas, LLC.

Latest Patents

Naumann is named on 1 patent: “Palletizer System with Centralized Palletizing Patterns.” The invention describes a palletizing system with one or more palletizers and a database that stores a library of stacking patterns. A connected computer can automatically select a pattern for an individual palletizer, allowing its pattern to be changed without affecting the others. The system also uses unique identifiers for each palletizer, supporting identification and expansion.

Career Highlights

Naumann’s documented patent contribution focuses on coordinating palletizing operations through centralized pattern storage and computer-based selection. The approach is designed to provide flexibility when managing multiple palletizers.

Collaborations

Naumann’s listed coworkers include Colin Shipley and Geoff Schreiber. His patent is associated with Toyota Automated Logistics Americas, LLC.

Conclusion

Kenneth David Naumann’s patent highlights a practical approach to managing palletizing patterns independently across multiple machines.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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