Kenneth A Lavallee

Title: Innovations of Kenneth A Lavallee

Introduction

Kenneth A Lavallee is a notable inventor based in Colchester, Vermont. He has made significant contributions to the field of integrated circuits, holding a total of 2 patents. His work focuses on improving the reliability and testing methods of integrated circuits, which are essential components in modern electronics.

Latest Patents

One of Kenneth's latest patents is titled "Low-voltage IC test for defect screening." This invention describes a system and method that utilizes low voltage current measurements to assess voltage network currents in integrated circuits. The process involves applying a low voltage current leakage test through IC chip connectors, developing specifications based on the chip's circuit delay, and determining the reliability of the chip based on its performance during testing. Another significant patent is "Method and system for determining common failure modes for integrated circuits." This method involves applying a test pattern to the device under test and comparing the output data to expected results. If discrepancies arise, the system checks for matching output signatures to identify common failure modes.

Career Highlights

Kenneth has worked with prominent companies in the technology sector, including IBM and Globalfoundries Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in integrated circuit technology.

Collaborations

Throughout his career, Kenneth has collaborated with talented individuals such as David V Gangl and Matthew Sean Grady. These partnerships have fostered innovation and enhanced the development of his inventions.

Conclusion

Kenneth A Lavallee's contributions to the field of integrated circuits through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the reliability and testing of electronic components, showcasing the importance of innovation in technology.