Yokohama, Japan

Kenji Tozuka

This inventor holds 1 USPTO granted patent. Top assignees: Hitachi Touhoku Software, Ltd., Hitachi, Ltd.. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Tozuka. Retrieved from https://idiyas.com/inventor/kenji-tozuka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Kenji Tozuka: Innovator in Fault Diagnosis Systems

Introduction

Kenji Tozuka is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of fault diagnosis through his innovative reasoning methods. His work has implications for various industries, particularly in enhancing the efficiency of diagnosing faulty components.

Latest Patents

Tozuka holds a patent for a "Reasoning method and fault diagnosis method and system implementing the." This patent describes a reasoning method that simplifies the modeling of diagnosis. It includes a diagnosis method based on this reasoning and a fault diagnosis system designed for efficient identification of faulty components. The system utilizes a combination of basic knowledge, expert heuristic knowledge, and meta-level knowledge to perform fault diagnosis effectively.

Career Highlights

Throughout his career, Kenji Tozuka has worked with prominent companies such as Hitachi, Ltd. and Hitachi Touhoku Software, Ltd. His experience in these organizations has allowed him to develop and refine his innovative ideas in fault diagnosis.

Collaborations

Tozuka has collaborated with notable colleagues, including Tsutomu Fujinami and Kouji Inoue. Their combined expertise has contributed to advancements in the field of fault diagnosis.

Conclusion

Kenji Tozuka's contributions to fault diagnosis systems highlight his innovative spirit and dedication to improving diagnostic methods. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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