This inventor holds 19 USPTO granted patents, primarily in Image Sensing Technology. Top assignees: Minolta Company, Ltd., Minolta Camera Kabushiki Kaisha. Active years: 1989-2010.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Takada. Retrieved from https://idiyas.com/inventor/kenji-takada
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 84.2
Average Co-Inventor Count = 2.5
ph-index = 9
Forward Citations = 272(Granted Patents)
Location History:
- Neyagawa, JP (1993)
- Osaka, JP (1989 - 1994)
- Itami, JP (1994 - 2010)
Company Filing History:
Years Active: 1989-2010
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Areas of Expertise:
Solid-State Image Sensing
Logarithmic Image Sensing
Image Pickup Device
Temperature Correction
Amplification
Charge Coupled Device
Color Filter
Pixel Response
Calibration Method
Manufacturing Method
Image Sensor
19 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Takada. Retrieved from https://idiyas.com/inventor/kenji-takada
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
