Mie, Japan

Kenji Sano

This inventor holds 1 USPTO granted patent. Top assignee: Panasonic Intellectual Property Management Co., Ltd.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Sano. Retrieved from https://idiyas.com/inventor/kenji-sano-u40hf6sb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Kenji Sano: Innovator in Ultrasonic Sensor Technology

Introduction

Kenji Sano is a prominent inventor based in Mie, Japan. He is known for his contributions to the field of ultrasonic sensor technology. With a focus on innovation, Sano has made significant strides in enhancing sensor capabilities.

Latest Patents

Kenji Sano holds a patent for an ultrasonic sensor. This invention showcases his expertise and commitment to advancing technology in this area. His work has the potential to impact various applications, making ultrasonic sensors more efficient and effective.

Career Highlights

Sano is currently associated with Panasonic Intellectual Property Management Co., Ltd. His role at this esteemed company allows him to leverage his skills and knowledge in the field of intellectual property and innovation. His dedication to his work has earned him recognition within the industry.

Collaborations

Throughout his career, Kenji Sano has collaborated with notable colleagues, including Naoki Tanaka and Masahiko Hashimoto. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Kenji Sano is a key figure in the realm of ultrasonic sensor technology. His innovative spirit and collaborative efforts continue to drive advancements in this field. His contributions are invaluable to the ongoing evolution of sensor technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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