Nagaokakyo, Japan

Kenji Matsui


Average Co-Inventor Count = 2.9

ph-index = 7

Forward Citations = 183(Granted Patents)


Location History:

  • Nagaokakyo, JP (1984 - 1990)
  • Kyoto, JP (1990 - 2007)

Company Filing History:


Years Active: 1984-2007

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9 patents (USPTO):Explore Patents

Title: Kenji Matsui: Innovator in Circuit Board Inspection Technology

Introduction

Kenji Matsui is a prominent inventor based in Nagaokakyo, Japan. He has made significant contributions to the field of circuit board inspection technology. With a total of 9 patents to his name, Matsui has developed innovative methods that enhance the precision and efficiency of detecting defects in printed circuit boards.

Latest Patents

One of Matsui's latest patents is a method and apparatus for inspecting printed circuit boards. This invention features a detection unit that identifies electric or magnetic fields above a circuit board. A control device enables the detection unit to perform detection processes while moving in a predetermined direction, with an electric current applied to the circuit board. This allows for the detection of electric or magnetic field distributions. The control device then compares the detection results with pre-registered reference data. If discrepancies are found, the circuit board is identified as defective. This technology allows for high-precision detection of defects in a non-contact manner.

Career Highlights

Throughout his career, Kenji Matsui has worked with notable companies such as Omron Tateisi Electronics Co. and Murata Manufacturing Co., Ltd. His experience in these organizations has contributed to his expertise in circuit board technology and innovation.

Collaborations

Matsui has collaborated with esteemed colleagues, including Yasuo Uchida and Noboru Kawaike. Their combined efforts have further advanced the field of circuit board inspection.

Conclusion

Kenji Matsui's innovative work in circuit board inspection technology has made a significant impact on the industry. His patents reflect a commitment to enhancing the accuracy and efficiency of defect detection in electronic components.

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