This inventor holds 5 USPTO granted patents. Top assignee: Hitachi, Ltd.. Active years: 1976-1979.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Mobara, JA (1976)
- Ibaraki, JA (1977)
- Mito, JP (1978 - 1979)
Company Filing History:
Years Active: 1976-1979
Title: Kenji Fukuda: Innovator in Optical Analysis
Introduction
Kenji Fukuda is a prominent inventor based in Mito, Japan. He has made significant contributions to the field of optical analysis, holding a total of 5 patents. His work focuses on developing methods and apparatuses that enhance the accuracy and efficiency of optical measurements.
Latest Patents
Fukuda's latest patents include a method and apparatus for optically analyzing specimens using two light beams. This innovative method involves initiating a wavelength scanning operation automatically after a predetermined time following the power source activation. It samples the ratio between reference light intensity and specimen light intensity, storing the signals in volatile memory for error-free measurements. Another notable patent is a spectrophotometer designed for measuring the transmittance of samples using an optical null method. This device utilizes two light beams that pass through a sample cell and a reference cell, providing precise measurements by detecting the intensity difference between the two light paths.
Career Highlights
Kenji Fukuda is currently employed at Hitachi, Ltd., where he continues to push the boundaries of optical technology. His work has been instrumental in advancing the capabilities of spectrophotometers and optical analysis methods.
Collaborations
Fukuda has collaborated with notable colleagues, including Yoshio Maeda and Koichi Matsumoto. Their combined expertise has contributed to the development of innovative solutions in optical analysis.
Conclusion
Kenji Fukuda's contributions to optical analysis through his patents and work at Hitachi, Ltd. highlight his role as a key innovator in the field. His advancements continue to influence the way optical measurements are conducted, ensuring greater accuracy and efficiency in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
