Tokyo, Japan

Kenji Demura

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenji Demura. Retrieved from https://idiyas.com/inventor/kenji-demura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 73(Granted Patents)


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Kenji Demura: Innovator in Respiratory Monitoring Technology

Introduction

Kenji Demura is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of respiratory monitoring technology. His innovative approach has led to the development of a unique device that enhances the understanding of respiratory gas consumption.

Latest Patents

Kenji Demura holds a patent for a respiratory gas consumption monitoring device and monitoring method. This invention is designed to provide accurate measurements of respiratory gas consumption, which can be crucial for various applications in health and fitness.

Career Highlights

Throughout his career, Kenji has focused on advancing technology in the health sector. His dedication to innovation has positioned him as a key figure in the development of monitoring devices that improve patient care and performance analysis.

Collaborations

Kenji has worked alongside talented individuals such as Mineo Okamoto and Hitoshi Yamaguchi. Their collaborative efforts have contributed to the success of his projects and the advancement of technology in their field.

Conclusion

Kenji Demura's work in respiratory monitoring technology exemplifies the impact of innovation on health and fitness. His contributions continue to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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