Company Filing History:
Years Active: 2015
Title: Kenichiro Komeda: Innovator in Surface Inspection Technology
Introduction
Kenichiro Komeda is a notable inventor based in Kumamoto, Japan. He has made significant contributions to the field of surface inspection technology, particularly through his innovative patent. His work is recognized for enhancing the accuracy and efficiency of surface inspection processes.
Latest Patents
Kenichiro Komeda holds a patent for a "Surface inspecting apparatus and method for calibrating same." This invention involves an illumination optical system that irradiates the surface of a contaminated standard wafer with illumination light. The light is then scanned over the surface, and detectors in a detection optical system detect the scattered light. A predefined reference value, along with the detection results, is used to calculate a compensation parameter 'Comp' for correcting the detection sensitivity of photomultiplier tubes. This parameter is managed by separating it into a time-varying deterioration parameter “P,” an optical characteristics parameter “Opt,” and a sensor characteristics parameter “Lr.” This innovative approach simplifies the calibration of detection sensitivity.
Career Highlights
Kenichiro Komeda is associated with Hitachi High-Technologies Corporation, where he applies his expertise in developing advanced technologies. His work has been instrumental in improving the performance of surface inspection systems, which are critical in various manufacturing processes.
Collaborations
Kenichiro has collaborated with notable colleagues, including Kenji Oka and Kenji Mitomo. Their combined efforts have contributed to the advancement of technologies in their field.
Conclusion
Kenichiro Komeda's contributions to surface inspection technology through his innovative patent demonstrate his commitment to enhancing industrial processes. His work continues to influence the field positively, showcasing the importance of innovation in technology.