Nagano, Japan

Kenichiro Amemiya

This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignee: Seiko Epson Corporation. Active years: 2008-2022.


% Patents Active = 33.3

 

Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2008-2022

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3 patents (USPTO):Explore Patents

Title: Kenichiro Amemiya: Innovator in Scanning Technology

Introduction

Kenichiro Amemiya is a notable inventor based in Nagano, Japan. He has made significant contributions to the field of scanning technology, holding a total of 3 patents. His work focuses on enhancing the efficiency and functionality of scanning systems.

Latest Patents

Amemiya's latest patents include a "Scan apparatus and scan result display program" and an "Image reading system." The scan apparatus is designed to read information from scanned receipts and display it in a user-friendly manner. It features a dual display system that shows both the content read from the receipt and an image of the scanned receipt. The system allows users to hide and reveal these displays based on their interactions. The image reading system incorporates advanced optical technologies to determine the size and orientation of the original document, ensuring accurate scanning results.

Career Highlights

Kenichiro Amemiya is currently employed at Seiko Epson Corporation, a leading company in imaging and printing technology. His work at Epson has allowed him to develop innovative solutions that improve scanning processes and enhance user experience.

Collaborations

Amemiya has collaborated with talented coworkers such as Toshiaki Ooshima and Kentaro Kanada. Their combined expertise has contributed to the successful development of advanced scanning technologies.

Conclusion

Kenichiro Amemiya's contributions to scanning technology reflect his dedication to innovation and improvement in the field. His patents demonstrate a commitment to enhancing user experience and functionality in scanning systems.

Profile summary based on public USPTO records.
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