Yokohama, Japan

Kenichi Otsuka

This inventor holds 1 USPTO granted patent. Top assignee: Ono Sokki Co., Ltd.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenichi Otsuka. Retrieved from https://idiyas.com/inventor/kenichi-otsuka-lzzh0wix

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Kenichi Otsuka: Innovator in Torque Measurement Technology

Introduction

Kenichi Otsuka is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of torque measurement technology. His innovative approach has led to the development of a highly accurate torque meter.

Latest Patents

Otsuka holds a patent for a torque meter that enables precise measurement of torque without interference from various loads. The design includes an elastic member situated in a power transmission channel, which deforms when torque is applied. A torque detecting arrangement measures the torque based on this deformation, ensuring accuracy in readings.

Career Highlights

Throughout his career, Kenichi Otsuka has been associated with Ono Sokki Co., Ltd., a company known for its advancements in measurement technology. His work has been instrumental in enhancing the reliability of torque measurements in various applications.

Collaborations

Otsuka has collaborated with notable colleagues, including Akio Takamura and Tooru Miyata. Their combined expertise has contributed to the success of their projects and innovations.

Conclusion

Kenichi Otsuka's contributions to torque measurement technology exemplify his dedication to innovation. His patented torque meter represents a significant advancement in the field, showcasing his ability to solve complex measurement challenges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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