Suntou-gun, Japan

Kenichi Nakao

USPTO Granted Patents = 5 

Average Co-Inventor Count = 2.6

ph-index = 2

Forward Citations = 16(Granted Patents)


Location History:

  • Suntoh-gun, JP (2010)
  • Boise, ID (US) (2016)
  • Suntou-gun, JP (2016 - 2021)

Company Filing History:


Years Active: 2010-2025

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5 patents (USPTO):Explore Patents

Title: Kenichi Nakao: Innovator in Inspection and Image Processing Technologies

Introduction

Kenichi Nakao is a prominent inventor based in Suntou-gun, Japan. He has made significant contributions to the fields of inspection systems and image processing technologies. With a total of 5 patents to his name, Nakao has demonstrated a commitment to innovation and excellence in his work.

Latest Patents

Nakao's latest patents include an item inspection system, an inspection method, and an information processing apparatus. The item inspection system features a portable system that reads information from a wireless device. It includes a position estimation unit that estimates the position of the portable system based on readings from a first wireless device installed at a known location. Additionally, the inspection unit inspects whether an item exists in a specific place based on readings from a second wireless device attached to the item. The system operates in two modes: one for position estimation and another for inspection. The inspection unit guides the user based on the item's position and the estimated position of the portable system.

Another notable patent is the image heating apparatus and image forming apparatus. This invention includes a heater with a substrate arranged orthogonally to the direction of recording material transport. It features a heat-generating element and an electrode that feeds electric power to the heat-generating element. The image formed on the recording material is heated by the heater's heat, with a conductive intermediate member provided between the terminal and the electrode.

Career Highlights

Kenichi Nakao has had a successful career at Canon Kabushiki Kaisha, where he has been instrumental in developing innovative technologies. His work has significantly impacted the efficiency and effectiveness of inspection and image processing systems.

Collaborations

Nakao has collaborated with notable coworkers, including Shigeo Murayama and Shinkichi Yamamoto. Their combined expertise has contributed to the advancement of technologies in their respective fields.

Conclusion

Kenichi Nakao's contributions to inspection systems and image processing technologies highlight his innovative spirit and dedication to advancing technology. His patents reflect a deep understanding of the challenges in these fields and a commitment to providing effective solutions.

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