Chiba, Japan

Kenichi Morishita

This inventor holds 1 USPTO granted patent. Top assignee: Nihon Medi-Physics Company, Limited. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenichi Morishita. Retrieved from https://idiyas.com/inventor/kenichi-morishita-dv4cd23y

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Kenichi Morishita: Innovator in Radioactive Diagnostic Agents

Introduction

Kenichi Morishita is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of radioactive diagnostic agents, particularly through his innovative patent.

Latest Patents

Morishita holds a patent titled "Method for preventing adhesion of thallium 201 to container." This invention discloses an agent for preventing the adhesion of thallium 201 to a container, which comprises a reducing substance as an active ingredient. Additionally, it presents a radioactive diagnostic agent wherein the adhesion of thallium 201 to a container is effectively prevented, incorporating both thallium 201 and a reducing substance.

Career Highlights

Kenichi Morishita is associated with Nihon Medi-Physics Company, Limited, where he applies his expertise in the development of medical technologies. His work has been instrumental in enhancing the efficacy of radioactive diagnostic procedures.

Collaborations

Some of his notable coworkers include Makoto Fukushima and Kazuhiro Kimura, who have collaborated with him on various projects within the company.

Conclusion

Kenichi Morishita's contributions to the field of radioactive diagnostic agents exemplify his innovative spirit and dedication to advancing medical technology. His patent on preventing the adhesion of thallium 201 is a testament to his impactful work in this specialized area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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