Inazawa, Japan

Kenichi Ikegami

This inventor holds 4 USPTO granted patents and 2 EPO patents. Top assignee: Jtekt Corporation. Active years: 2011-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenichi Ikegami. Retrieved from https://idiyas.com/inventor/kenichi-ikegami

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 1.3

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2011-2018

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4 patents (USPTO):Explore Patents

Title: Kenichi Ikegami: Programmable Logic Controller Innovations.

Introduction

Kenichi Ikegami is an inventor based in Inazawa, Japan. His work includes inventions for programmable logic controllers (PLCs), with a focus on program preparation and memory inspection. He is associated with JTEKT Corporation and has 4 patents.

Latest Patents

One of Ikegami’s latest patents concerns a programming assist device and method for PLC programs. The invention generates and checks intermediate codes before creating separate executable files for redundant PLC CPUs. By verifying that the converted and reconverted codes match, the method helps reduce the risk of a PLC emergency stop caused by converter software failure.

Another patent describes a method for inspecting a PLC’s random-access memory (RAM). The inspection region is divided into blocks, and a control device writes and checks values across every combination of two blocks. This approach is designed to inspect all unit storage regions within minutes while meeting a predetermined safety standard.

Career Highlights

Ikegami’s patent work addresses reliability and safety in industrial control systems. His inventions focus on practical ways to prepare PLC programs for redundant CPUs and to inspect memory efficiently.

Collaborations

Ikegami is associated with JTEKT Corporation. His listed coworker is Tsutomu Araki.

Conclusion

Kenichi Ikegami’s inventions contribute to PLC programming and memory-inspection methods designed to support dependable industrial control systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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