Kuwana, Japan

Kenichi Hashimoto

This inventor holds 1 USPTO granted patent. Top assignee: Brother Kogyo Kabushiki-Kaisha. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kenichi Hashimoto. Retrieved from https://idiyas.com/inventor/kenichi-hashimoto-l4dhur0h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Kenichi Hashimoto: Sewing-Machine Innovation

Introduction

Kenichi Hashimoto is an inventor associated with Kuwana, Japan, and Brother Industries, Ltd. His patent work addresses ways to help sewing-machine operators preview stitch patterns and understand their dimensions.

Latest Patents

Hashimoto is credited with 1 patent: “Sewing Machine Capable of Forming Plural Stitch Patterns.” The invention describes a visual display that shows how a stitch pattern will appear and provides its dimensions in both the fabric-feed direction and the transverse, cross-feed direction. The machine determines the transverse dimensions from the pattern’s width data and its greatest extensions above and below a reference line. It calculates the length by summing the length data for each pattern element.

Career Highlights

Hashimoto’s listed patent reflects an effort to make stitch-pattern selection more informative by combining a visual preview with dimensional data. This information can help an operator assess a pattern before sewing.

Collaborations

Hashimoto’s listed coworker is Mitsuyasu Kyuno. His company is Brother Industries, Ltd., also known as Brother Kogyo Kabushiki-Kaisha.

Conclusion

Kenichi Hashimoto’s patent documents a sewing-machine display innovation that presents stitch-pattern appearance and dimensions to support informed pattern selection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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