Kahoku, Japan

Kengo Kadoya

This inventor holds 1 USPTO granted patent. Top assignee: Pfu Limited. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kengo Kadoya. Retrieved from https://idiyas.com/inventor/kengo-kadoya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: The Innovations of Kengo Kadoya

Introduction

Kengo Kadoya is a notable inventor based in Kahoku, Japan. He has made significant contributions to the field of technology, particularly with his innovative designs and patents. His work has garnered attention for its practicality and efficiency.

Latest Patents

Kadoya holds a patent for a scanner, showcasing his expertise in developing advanced technological solutions. This patent reflects his commitment to enhancing the functionality and usability of scanning devices. He has 1 patent to his name, which highlights his focused approach to innovation.

Career Highlights

Kadoya is currently employed at PFU Limited, a company known for its dedication to producing high-quality imaging and scanning solutions. His role at PFU Limited allows him to work on cutting-edge projects that push the boundaries of technology.

Collaborations

Throughout his career, Kadoya has collaborated with talented individuals such as Motoshi Shibuya and Satoshi Kuroda. These partnerships have fostered a creative environment that encourages the exchange of ideas and innovation.

Conclusion

Kengo Kadoya's contributions to the field of technology through his patent for a scanner and his work at PFU Limited demonstrate his dedication to innovation. His collaborations with other skilled professionals further enhance his impact in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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