North-Kingstown, RI, United States of America

Kendell W Gordon, Jr

This inventor holds 1 USPTO granted patent. Top assignee: Lawson Hemphill, Inc.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kendell W Gordon, Jr. Retrieved from https://idiyas.com/inventor/kendell-w-gordon-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of Kendell W. Gordon, Jr.

Introduction

Kendell W. Gordon, Jr. is an accomplished inventor based in North Kingston, Rhode Island. He has made significant contributions to the field of textile evaluation through his innovative patent. His work focuses on enhancing the efficiency and accuracy of fabric analysis.

Latest Patents

Kendell holds a patent for a "System for electronically evaluating yarn or fabric samples cell by cell." This method involves electronically assessing yarn or fabric samples by dividing them into one or more cells. The cells are then compared to each other or to reference cells, allowing for precise evaluations.

Career Highlights

Kendell is currently employed at Lawson Hemphill, Inc., where he applies his expertise in textile technology. His role involves developing and refining methods that improve the quality and performance of fabric evaluation processes.

Collaborations

Kendell collaborates with Avishai Nevel, a fellow innovator in the field. Together, they work on advancing textile evaluation techniques and exploring new possibilities in fabric technology.

Conclusion

Kendell W. Gordon, Jr. exemplifies the spirit of innovation in the textile industry. His contributions through his patent and work at Lawson Hemphill, Inc. highlight the importance of technological advancements in fabric evaluation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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