Kakogawa, Japan

Ken′ichi Okuno

This inventor holds 1 USPTO granted patent. Top assignee: Sysmex Corporation. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ken′ichi Okuno. Retrieved from https://idiyas.com/inventor/kenandprimeichi-okuno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Ken’ichi Okuno: Innovator in Quality Control Technology

Introduction

Ken’ichi Okuno is a notable inventor based in Kakogawa, Japan. He has made significant contributions to the field of quality control technology, particularly in the development of methods and devices that enhance the efficiency of analyzers.

Latest Patents

Ken’ichi Okuno holds a patent for a "Support method, quality control method, and device therefor." This invention addresses issues in analyzers and facilitates effective external quality control management. The system allows for the remote operation of an analyzer through a control device connected via a network. It enables the transmission of error data and sample data from quality control substances, allowing for real-time external quality control.

Career Highlights

Ken’ichi Okuno is associated with Sysmex Corporation, a company renowned for its innovations in medical diagnostics and laboratory equipment. His work has contributed to advancements in the field, particularly in enhancing the reliability and efficiency of quality control processes.

Collaborations

Ken’ichi has collaborated with notable colleagues such as Hiroyuki Morihara and Tadayuki Yamaguchi, who have also contributed to the advancements in quality control technologies.

Conclusion

Ken’ichi Okuno's innovative work in quality control technology exemplifies the impact of dedicated inventors in improving analytical processes. His contributions continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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