Atsugi, Japan

Ken Odashiro

USPTO Granted Patents = 2 


Average Co-Inventor Count = 1.5

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2006-2023

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2 patents (USPTO):Explore Patents

Title: Ken Odashiro: Innovator in Thermal Detection Technologies

Introduction

Ken Odashiro is a notable inventor based in Atsugi, Japan. He has made significant contributions to the field of thermal detection technologies, holding two patents that showcase his innovative spirit and technical expertise.

Latest Patents

Odashiro's latest patents include a Thermal History Detection Label and a Temperature Sensor Label. The Thermal History Detection Label is designed to monitor thermal history over a specific temperature range while minimizing the increase in label size. This label detects thermal history through the permeation of a molten material into a permeation body, utilizing a combination of two permeating materials with different melting points. The Temperature Sensor Label features a waxed layer on a colored paper, which is formed from a mixture of viscous material and powdered petroleum wax that melts at a predetermined temperature. This innovative design allows for accurate temperature sensing in various applications.

Career Highlights

Throughout his career, Ken Odashiro has worked with prominent companies such as Gee Quest and Sysmex Corporation. His experience in these organizations has allowed him to refine his skills and contribute to the development of cutting-edge technologies in thermal detection.

Collaborations

Odashiro has collaborated with talented individuals in his field, including Kazuyoshi Horii and Shoichi Banno. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Ken Odashiro's work in thermal detection technologies exemplifies his commitment to innovation and excellence. His patents reflect a deep understanding of material science and engineering, making him a valuable contributor to the field.

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