Yokohama, Japan

Ken Nakano

This inventor holds 1 USPTO granted patent. Top assignees: Fujitsu Corporation, Other. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ken Nakano. Retrieved from https://idiyas.com/inventor/ken-nakano-entifp8f

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:

goldMedal1 out of 39,378 
 
Fujitsu Corporation
 patents
silverMedal1 out of 834,570 
Other
 patents
where one patent can have more than one assignee

Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Ken Nakano: Innovator in Authentication Technology

Introduction

Ken Nakano is a prominent inventor based in Yokohama, Japan. He is known for his innovative contributions to authentication technology. His work focuses on enhancing security through the integration of physical and behavioral characteristics.

Latest Patents

Ken Nakano holds a patent for an authentication device, authentication system, and sensor. The invention relates to an authentication device that performs authentication by utilizing both physical characteristics, such as fingerprints, and behavioral characteristics, such as movement. This comprehensive approach to authentication leverages time-series data to improve security measures.

Career Highlights

Throughout his career, Ken Nakano has worked with notable companies, including Fujitsu Corporation. His experience in the technology sector has allowed him to develop cutting-edge solutions in the field of authentication.

Collaborations

Ken Nakano has collaborated with Jun Hyodo, contributing to advancements in authentication technology.

Conclusion

Ken Nakano's innovative work in authentication technology demonstrates his commitment to enhancing security through the integration of various characteristics. His contributions continue to influence the field and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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